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X-Ray Fluorescence
Spectroscopy is used to determine the elemental composition of materials and
the thickness of any lead finish or coating. It is also used to analyze the
elemental concentration of solids and solutions, and identify specific and trace
elements in a material.
XRF is considered to be the best method for verifying
RoHS lead-free compliance. It is non-destructive since only low energy X-rays
are used, and does not have damaging effects on the electronic components or
assemblies. It does not require additional sample preparation (unlike the
SEM),
and involves a short analysis time.
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