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X-Ray Fluorescence (XRF)


X-Ray Fluorescence Spectroscopy is used to determine the elemental composition of materials and the thickness of any lead finish or coating. It is also used to analyze the elemental concentration of solids and solutions, and identify specific and trace elements in a material.

XRF is considered to be the best method for verifying RoHS lead-free compliance. It is non-destructive since only low energy X-rays are used, and does not have damaging effects on the electronic components or assemblies. It does not require additional sample preparation (unlike the SEM), and involves a short analysis time.



SIX SIGMA utilizes Thermo Noran's XRF equipped with advanced software which is capable of measuring the thickness and composition of a sample that has up to five layers with five elements per layer.  It can also measure  the composition of bulk alloys with up to 30 elements.

Main display of the XRF

Pulse Height Analysis Spectrum

Applicable Specifications & Standards:

  • ASTM B568
    Measurement of Coating Thickness by X-Ray Spectrometry